An analytical study on surface oxidation mechanisms of metal nitride films by means of soft X-ray photoelectron and absorption spectroscopy

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An analytical study on surface oxidation mechanisms of metal nitride films by means of soft X-ray photoelectron and absorption spectroscopy

利用条件: 著作権あり

人物: 江坂, 文孝
時間: 1997年
所在: 国立国会図書館デジタルコレクション

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Electronic Structure of Carrier-doped SrTiO3 Studied by Soft-X-ray Spectroscopy

Electronic Structure of Carrier-doped SrTiO3 Studied by Soft-X-ray Spectroscopy

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登録日: 2020-12-17